Interface Structure-Property Relations Through Aberration-Corrected STEM
نویسندگان
چکیده
منابع مشابه
Uncovering Structure-Properties Relations in Fuel Cells and Catalysts with Quantitative Aberration-Corrected STEM and EELS
Advances in materials science of fuel cells and catalysts promise global benefits: increased efficiency in power generation, decreased harmful emissions, and reduced energy use. Keys to fundamental understanding of the behavior of these materials, however, often lie on nanoor even atomic scales: functionality of solid oxide fuel cells is ultimately controlled by the static and dynamic behavior ...
متن کاملMonochromator for Aberration-Corrected STEM
In a scanning transmission electron microscope (STEM), the elemental analysis at atomic resolution is realized by the combination with electron energy-loss spectroscopy (EELS), since an aberration corrected probe forming lens system enables us to obtain an electron probe sized about 0.1 nm [1]. In EELS, the energy resolution is mainly limited by the energy spread of the electron source, which i...
متن کاملHitachi’s Spherical Aberration Corrected STEM: HD-2700
INTRODUCTION AS VLSI (very large scale integration) technology evolves toward ever smaller features and multilayer designs, analysis and control of structures and compositions at the atomic level is becoming increasingly important. In 1998 Hitachi HighTechnologies Corporation released the HD-2000, a STEM (scanning transmission electron microscope) that was very well received for combining the e...
متن کاملAberration corrected STEM of iron rhodium nanoislands
Iron-rhodium (FeRh) nanoislands of equiatomic composition have been analysed using scanning transmission electron microscopy (STEM) electron energy loss spectroscopy(EELS) and high angle annular dark field (HAADF) techniques. Previous magnetometry results have lead to a hypothesis that at room temperature the core of the islands are antiferromagnetic while the shell has a small ferromagnetic si...
متن کاملAberration-Corrected Four-Detector STEM-EDS Analysis of Embedded Nanoclusters
Examining small particles embedded in a specimen foil is a challenging application for analytical STEM methods. When the particles are ~2 nm or smaller and the foils must be prepared by FIB (which results in thicker foils and more surface damage), the challenges increase. Here we report the use of aberrationcorrected STEM, equipped with high-detection-efficiency EDS systems, and multivariate st...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2010
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927610059787